Objectives: The aim of this course is to present the main methods of microscopic analysis for application in nanosciences
Outline (with number of hours per part) |
Lect |
PSS |
LW |
Electron
microscopy far field and near field. |
4h |
||
Scanningtunnelingmicroscopy(STM)principleandinstrumentation. Theoretical
interpretation of images. Application in surface, growth of nanostructues.
Ad-atom or molecule adsorbed. |
3h |
4h |
|
Applications to graphene, carbon nanotubes, fullerenes and molecular
electronic applications Single electron devices. Coulomb blockade. |
3h |
2h |
|
Atomic force microscopy (AFM): principles, the forces involved. Imagery
modes: contact, non-cotact, tapping. Resolution, amplitude and phase imaging. |
3h |
2h |
6h |
|
1,5h |