Objectives: The aim of this course is to present the main methods of microscopic analysis for application in nanosciences

Outline (with number of hours per part)

Lect

PSS

LW

Electron microscopy far field and near field.
Electron microscopy. Scanning electron microscope. Interaction electron/material. Images formation Applications. Transmission electron microscope. Image formation-diffraction. High resolution imaging for single nanoparticle. Quantitative characterization of chemically ordered nanostructures. 3D morphology of clusters. Spectroscopy EDX and EELS. New generation of microscopes: dynamical process at high resolution with single atom sensitivity

4h



Scanningtunnelingmicroscopy(STM)principleandinstrumentation. Theoretical interpretation of images. Application in surface, growth of nanostructues. Ad-atom or molecule adsorbed.
Beyond topographic images, local spectroscopy.

3h

4h


Applications to graphene, carbon nanotubes, fullerenes and molecular electronic applications Single electron devices. Coulomb blockade.
SP-ST: Nanomagnetism and spintronic. Kondo effect and Fano resonance

3h

2h


Atomic force microscopy (AFM): principles, the forces involved. Imagery modes: contact, non-cotact, tapping. Resolution, amplitude and phase imaging.
Scanning friction microscopy, adhesion, indenter.

3h

2h

6h


Scanning magnetic force microscopy (MFM) and applications.
Near field optical microscopy.

1,5h